Annealing temperature effect on the Structure, Morphology and Optical properties of Copper Oxide CuO thin Films
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Abstract
Copper oxide (CuO) thin films were deposited on glass substrates by (sol-gel ) method using a spin -Coating technique and the speed of the spin coater was fixed at 3000 rpm for 30 sec and the samples were are annealed at temperatures (250,350,450 and 550) ° C for 1 hrs. The structural, Morphology, and optical properties of the film are determined by using X-ray diffraction (XRD), Atomic force microscopy (AFM) and UV-visible spectroscopy respectively. The XRD patterns showed that copper oxide (CuO) thin films prepared has polycrystalline structure and when increase the annealing temperature of the thin film over than 300° C the thin film turns from phase Cu2O to CuO phase and through examination (AFM) showed that the average grain size increases with the annealing temperature either Optical examinations showed decrease in transmission and increase in absorption coefficient with increase annealing temperature. The prepared thin films have direct energy gap and the value of the optical energy gap decreased with increasing annealing temperature from 3.99 eV to 3.94 eV
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